时钟抖动和相位噪声对采样系统的影响

技术分类: 测试与测量  模拟设计  | 2005-03-05
Brad Brannon,Analog Devices Inc

Aperture Uncertainty and ADC System Performance," Applications Note AN-501, Analog Devices, www.analog.com.
  2,Smith, Paul, "Little Known Characteristics of Phase Noise," Applications Note AN-741, Analog Devices, www.analog.com.
  3,Oppenheimer, Alan V, Alan S Willsky, and S Hamid, Signals and Systems, Prentice-Hall, 1983.
  4,Bowick, Christopher, RF Circuit Design, Sams Publishing, 1995.
  5,Kester, Walt, Editor, Analog-Digital Conversion, Analog Devices Inc, 2004.
  6,Curtin, Mike, and Paul
O'Brien, "Phase-locked loops for high-frequency receivers and transmitters: Part 2," Analog Dialogue, Volume 33, No. 5, May 1999, www.analog.com.
  7,Brannon, Brad, "Sampled Systems and the Effects of Clock Phase Noise and Jitter," Application Note AN-756, Analog Devices, www.analog.com.

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